Wafer quality control system: Best technology fo most reliable inspection results
The wafer inspection system WIS-06 inspects silicon wafers used in photovoltaic industry and sorts them according to their quality.
The WIS-06 wins over manufacturers thanks to its flexible modular set-up. An in-house designed laser combined with new cameras detects saw marks and the bow accurately, especially on wafers which have been cut with resin-bonded or electroplated diamond wire. Furthermore, the optional transflection technology detects µ-cracks and reduces the negative impact of grains on the surface of poly wafers. Moreover, the matrix system not only spots saw marks on the edge of wafers but also on whole the surface.